Meta tags:
description=IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis;
keywords=IONTOF, TOF-SIMS, LEIS, company, products, time of flight, secondary ion mass spectrometry, low energy ion scattering, ion scattering spectroscopy, iss, surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis, 3D analysis;
author=IONTOF;

Headings (most frequently used words):

-

Text of the page (most frequently used words):
the (86), and (43), iontof (32), for (31), sims (25), high (18), 2026 (15), tof (15), ion (14), with (13), mass (13), #surface (11), resolution (11), more (10), instrument (9), analysis (9), performance (8), products (8), leis (7), read (7), can (7), data (7), service (7), user (6), spectrometry (6), information (6), plus (6), applications (6), are (6), about (6), virtual (5), school (5), qtac (5), characterisation (5), different (5), depth (5), surfacelab (5), news (5), analytical (5), events (4), sales (4), low (4), energy (4), scattering (4), metals (4), provides (4), organic (4), hybrid (4), end (4), ideal (4), software (4), imaging (4), profiling (4), nanoprobe (4), latest (4), primary (4), lateral (4), detection (4), beam (4), our (4), application (4), technique (4), usa (3), sensitivity (3), many (3), materials (3), catalysts (3), top (3), atomic (3), layer (3), orbitrap (3), combines (3), analyser (3), even (3), new (3), situ (3), spm (3), tool (3), advanced (3), ultimate (3), source (3), currents (3), well (3), system (3), rates (3), improved (3), this (3), technology (3), one (3), event (3), release (3), time (3), works (3), you (3), request (3), download (3), area (3), support (3), all (3), group (3), paper (3), glass (3), coatings (3), semiconductor (3), datenschutz (2), privacy (2), policy (2), impressum (2), ecasia (2), brussels (2), belgium (2), ald (2), tampa (2), florida (2), 251 (2), 1622 (2), germany (2), offers (2), research (2), areas (2), such (2), polymers (2), quantitative (2), extension (2), first (2), highest (2), accuracy (2), features (2), properties (2), three (2), developments (2), platform (2), measurements (2), making (2), nano (2), interpretation (2), spectra (2), experienced (2), package (2), option (2), also (2), solution (2), ideally (2), suited (2), ms2 (2), optimised (2), interferences (2), transmission (2), generation (2), pulsed (2), below (2), bipolar (2), bunching (2), repetition (2), extremely (2), limits (2), operation (2), design (2), extraction (2), level (2), molecular (2), combination (2), has (2), been (2), combine (2), ground (2), breaking (2), instruments (2), instrumentation (2), industrial (2), industriemechaniker (2), feinwerkmechaniker (2), nanotechnologie (2), jobs (2), help (2), customer (2), feedback (2), notes (2), find (2), team (2), development (2), history (2), only (2), policies (2), longstanding (2), experience (2), vision (2), career (2), forum (2), facts (2), learn (2), special (2), very (2), pharmaceuticals (2), biomaterials (2), paints (2), polymer (2), how (2), online, upcoming, 100, 199, com, phone, fax, email, gmbh, heisenbergstraße, 48149, münster, extreme, makes, perfect, study, processes, production, semiconductors, fuel, cells, commercial, which, 240, 000, enables, distinction, highly, complex, samples, meets, regarding, chemical, composition, physical, dimensional, structure, devices, nanometre, scale, crucial, nanoscience, nanotechnology, possibility, perform, combining, quite, challenging, requires, reasonably, facilitate, tools, libraries, now, cost, effective, quick, confirmation, anticipated, contaminants, compositions, fast, key, sequential, full, ms1, streams, individually, conditions, precursor, selection, avoid, fragmentation, pattern, bismuth, cluster, operate, khz, allowing, microanalysis, column, measurement, separated, ease, guaranteed, revolutionary, optics, transfer, allows, containing, molecules, resolved, higher, range, thus, facilitating, peak, identification, times, lower, achieved, dual, its, called, delayed, mode, market, spot, sizes, developed, technologies, make, benchmark, academic, step, ahead, excited, announce, machine, jop, opening, current, job, openings, aktuelle, stellenausschreibungen, close, cooperation, tascon, specialised, get, better, send, your, suggestions, report, any, problems, services, please, complete, form, registration, june, users, access, updates, helpfiles, brochures, here, supports, potential, customers, best, their, demands, when, needed, there, waste, available, since, 1989, contribution, unceasing, not, committed, developing, that, safe, environmentally, sound, successful, deep, understanding, challenges, combined, interested, challenge, innovative, working, environment, might, place, success, based, field, skills, scientists, engineers, participates, conferences, workshops, other, over, world, stay, touch, around, today, consists, four, companies, located, japan, catalysis, essential, major, advantage, opportunity, surfaces, treated, obtain, these, modifications, investigated, powerful, non, conductive, used, determine, distribution, ingredients, within, pharmaceutical, ability, image, compounds, useful, biological, increasing, importance, reasons, decoration, stability, discolourations, often, caused, phase, separation, material, components, quantification, trace, important, task, industry, versatile, acquisition, sensitive, providing, unique, capabilities, multi, purpose, guaranteeing, superior, start, flight, secondary, retrospective,

Text of the page (random words):
iontof tof sims time of flight secondary ion mass spectrometry leis low energy ion scattering ion beam technology products for surface spectrometry surface analysis depth profiling surface imaging 3d analysis retrospective analysis start products m6 m6 plus m6 hybrid sims qtac surfacelab 7 tof sims leis technique applications semiconductor polymer paints and coatings biomaterials pharmaceuticals glass paper metals catalysts about iontof iontof group news events data facts career forum vision policies history support service sales download area virtual iontof user school 2026 information request customer feedback analytical service datenschutz privacy policy impressum products sims instrumentation m6 the latest multi purpose instrument guaranteeing superior performance in all application areas m6 plus the m6 plus platform combines high end sims performance with in situ spm capabilities m6 hybrid sims high performance tof sims and orbitrap sims combination instrument ideally suited for organic sims application low energy ion scattering qtac extremely surface sensitive instrument providing unique and quantitative characterisation of the top atomic layer software surfacelab 7 versatile instrument operation data acquisition and data analysis software package for all iontof instruments how it works tof sims and leis learn more about how advanced surface analysis works applications applications semiconductor the detection and quantification of trace metals is an important analytical task in the semiconductor industry polymer discolourations on polymers are often caused by phase separation of the material s components paints and coatings coatings are of increasing importance for many industrial products for reasons of decoration as well as stability biomaterials the ability to image molecular compounds with high special resolution is very useful for biological applications pharmaceuticals sims can be used to determine the distribution of the different ingredients within pharmaceutical products glass tof sims is a very powerful technique for the analysis of non conductive materials e g glass paper paper surfaces are treated to obtain special surface properties these modifications can be investigated metals one major advantage of tof sims is the opportunity to combine high lateral and high depth resolution catalysts for catalysis the characterisation of the top atomic layer is essential leis is the ideal technique for this application about iontof about iontof iontof group today the iontof group consists of four different companies located in germany the usa and japan news stay in touch with iontof and learn more about the latest development around our products and applications events iontof participates in many different conferences workshops and other events all over the world data facts iontof s success is based on the longstanding experience in the field and the skills of our scientists and engineers career forum if you are interested in a new challenge in an innovative working environment iontof might be the place for you vision one can only be successful if deep understanding of the challenges can be combined with longstanding experience policies iontof is not only committed to developing products that are safe and environmentally sound history since 1989 the contribution of iontof to the development of the tof sims technique has been unceasing support support service when help is needed there is no time to waste the iontof service team is available sales the iontof sales team supports potential customers to find the best solution for their demands find brochures and application notes here download area the iontof download area for access to the surfacelab software updates helpfiles and release notes virtual iontof user school 2026 registration and information for the virtual iontof user school in june 2026 for our tof sims instrument users information request for information about our products and services please complete the information request form customer feedback help us to get even better and send us your suggestions or report any problems you experienced analytical service for analytical service iontof works in a close cooperation with tascon specialised in analytical service jobs aktuelle stellenausschreibungen industriemechaniker feinwerkmechaniker nanotechnologie m w d current job openings no jop opening at this time m6 the ultimate sims machine advanced ion beam technology for surface analysis news event 15 18 06 2026 virtual iontof user school 2026 jobs at iontof m w d industriemechaniker feinwerkmechaniker nanotechnologie news iontof is excited to announce the release of surfacelab 7 6 event 28 06 01 07 2026 ald 2026 tampa florida usa news surfacelab 7 5 release event 15 18 09 2026 ecasia 2026 brussels belgium m6 sims technology one step ahead the m6 is the latest generation of high end tof sims instruments developed by iontof ground breaking ion beam and mass analyser technologies make the m6 the benchmark in sims instrumentation and the ideal tool for industrial and academic research read more ground breaking developments for the m6 the m6 tof analyser the revolutionary design of the extraction optics the ion transfer and detection system provides a new level of mass resolution mass accuracy and transmission this level of performance allows mass interferences of e g ch 13 c ch 2 n containing molecules to be resolved even in the higher mass range thus facilitating molecular peak identification in combination with high repetition rates and the improved primary ion currents of the nanoprobe 50 three times lower detection limits can be achieved in dual beam depth profiling its design has also been optimised for the measurements in the so called delayed extraction mode making it the first tof sims instrument on the market to combine high resolution imaging with spot sizes below 50 nm with high mass resolution spectrometry read more nanoprobe 50 the nanoprobe 50 is the latest generation bismuth cluster ion source for the m6 the source provides pulsed primary ion currents of up to 40 pa and an ultimate lateral resolution of well below 50 nm the bipolar bunching system can operate at repetition rates of up to 50 khz allowing for extremely high data rates and improved detection limits the nanoprobe 50 is the ideal primary ion source for high lateral resolution microanalysis and imaging as well as high mass resolution surface spectrometry and depth profiling 1 50 nm lateral resolution guaranteed 2 bipolar bunching system for improved spectrometry performance and ease of operation 3 in column measurement of mass separated pulsed primary ion currents read more tof ms ms the interpretation of organic tof sims spectra can be quite challenging and requires a reasonably experienced user to facilitate data interpretation iontof provides different tools such as spectra libraries advanced software package and the ultimate performance orbitrap tm extension for the m6 with the tof ms ms option iontof now also offers a more cost effective ms ms solution for the m6 the option is ideally suited for quick confirmation of anticipated contaminants or compositions and fast ms ms imaging or depth profiling applications key features of the tof ms ms are 1 high transmission 80 and sensitivity 2 high mass resolution precursor selection to avoid ms2 fragmentation pattern interferences 3 sequential full ms1 and ms2 data streams with individually optimised analysis conditions read more the m6 plus combining sims and spm in situ m6 plus the tool for nano characterisation information regarding the chemical composition physical properties and three dimensional structure of materials and devices at the nanometre scale is crucial for new developments in nanoscience and nanotechnology the m6 plus platform combines the high end performance of the m6 with the possibility to perform in situ spm measurements making it the ideal tool for high end nano characterisation read more the m6 hybrid sims hybrid sims surface analysis meets organic mass spectrometry with the orbitrap tm extension for the m6 iontof provides the first commercial sims instrument which combines the highest mass resolution 240 000 and highest mass accuracy tm analyser enables the distinction of different features even in highly complex organic samples read more the qtac high performance low energy ion scattering leis quantitative top atomic layer characterisation with the qtac iontof offers a high sensitivity low energy ion scattering leis instrument the extreme surface sensitivity of leis makes the qtac the perfect instrument to study surface processes in many production and research areas on materials such as catalysts semiconductors metals polymers and fuel cells read more iontof gmbh heisenbergstraße 15 48149 münster germany phone fax email 49 0 251 1622 100 49 0 251 1622 199 sales iontof com upcoming events 15 18 06 2026 virtual iontof user school 2026 online 28 06 01 07 2026 ald 2026 tampa florida usa 15 18 09 2026 ecasia 2026 brussels belgium impressum privacy policy datenschutz