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nenovision we develop and produce afm in sem litescope applications semiconductors battery energy materials material science life science products litescope afm in sem customized solutions modules accessories probes technology measurement modes principal benefits correlative microscopy cpem sem integration news resources product materials application notes webinars articles about us company distributors projects references collaborations career contact us semiconductor failure analysis in situ site specific electrical and topographical characterization of semiconductor components at the nanoscale learn more litescope afm in sem merge the power of afm and sem in a single tool to explore the secrets of nanoworld learn more battery component materials analyses introducing our battery component materials research solution learn more next level of imaging contact us to discuss your own application learn more litescope 2 5 this award winning tool within the field of in situ correlative microscopy has the potential to revolutionize the way you perform correlative analysis in situ multimodal correlative analysis optimized time efficient workflow ultimate performance inside sem open hardware design for easy customization the new generation of litescope afm in sem is built on the completely new state of the art control unit nenobox leveraging the performance and capabilities of the afm in sem to the new level check our introduction video by our ceo jan neuman below do you want to know more details then click the contact us button contact us play video benefits of afm in sem solution combining the strengths of atomic force microscope and scanning electron microscope opens a wide range of possibilities thanks to seamless integration and one click operations is possible to correlate various measurements in real time see the unique benefits of the afm in sem solution which assure you measurement results impossible to reach by separate afm and sem techniques check the biggest advantages of in situ analysis by using them simultaneously correlative multimodal sample analysis cutting edge cpem technology allows the simultaneous acquisition of afm and sem data and their seamless correlation learn more in situ sample characterization in situ conditions inside the sem ensure sample analysis at the same time in the same place and under the same conditions learn more precise localization of the region of interest extremely precise and timesaving approach uses sem to navigate the afm tip to the region of interest enabling its fast easy localization learn more merge the forces of afm and sem applications afm in sem offers a broad field of sample analysis simultaneous utilization of scanning electron microscope and atomic force microscope is indispensable for advanced 3d correlative analysis while reducing overal image acquisition time the easy efficient workflow assures fast and quality measurement results with the ultra high resolution and unparalleled accuracy of image alignment the versatility of litescope brings the new possibilities into variety of application areas material science battery energy materials semiconductors life science products we develop and produce afm in sem litescope used for correlative and multimodal in situ analysis of microscopic samples learn about our unique afm in sem solution and its capabilites modalities that can change the way you characterize the samples litescope afm in sem probes accessories measurements modes unique technology for correlative imaging the correlative probe electron microscopy cpem is a cutting edge technology developed specially for seamless integration of afm and sem learn more about cpem do you want to learn more feel free to contact us latest news event 10 09 2026 nenovision at istfa 2026 booth 610 san antonio product product 12 07 2026 by andrea karas litescope phenom now live with aptco group product event 25 06 2026 by andrea karas where to meet nenovision in 2026 five conferences across three continents technology other 14 05 2026 by andrea karas from brno to taiwan litescope meets the heart of the semiconductor world semiconductors nenovision contact us terms conditions follow us facebook twitter youtube linkedin nenovision s r o purkyňova 649 127 612 00 brno czech republic vat cz04525671 2025 nenovision s r o webpage created by puxdesign in brno region váš prohlížeč není podporován nainstalujte si prosím některý z podporovaných prohlížečů chrome firefox pokračovat na web