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fasthr raith sectors by enabling a wide variety of applications for industry and academia we enable building their digital future explore how nanotechnology enables your business optical telecommunication consumer electronics research rapid prototyping semiconductors defense space quantum technologies materials science life sciences our insights photonics sectors solutions our nanofabrication solutions pave the way from breakthrough innovations and rapid prototyping to volume production of nanotechnology devices patterning digital raith mix and match holography workflow process control solutions products our unique combination of high precision writing imaging and analysis tools is designed to meet the most demanding requirements in the field providing unparalleled precision and efficiency electron beam lithography focused ion beams laser lithography imaging analysis explore electron beam lithography the crucial technology for generating nanostructures essential in shaping tomorrow s devices particularly in semiconductors optoelectronics and quantum technologies product overview ebpg highest throughput automation and precision voyager high performance for shortest time to result pioneer e line raith150 multifunctional system family for maximum versatility elphy upgrade kit for sem or fib sem experience ion beams across various fields with our fib sem nanofabrication ion microscopy and sims nanoanalytics systems product overview velion multi ion species fib sem ionmaster sims analysis for high resolution nm scale elemental mapping elphy upgrade kit for sem or fib sem discover laser lithography with multi beam technology for enhanced throughput and scalable resolution or choose single beam systems with unmatched lateral and gray level resolutions product overview picomaster direct laser writers with ultimate resolution picomaster xf highest throughput grayscale lithography athos light years ahead in optical security and holographic packaging explore precise imaging and analysis tools for enhanced understanding and progress offering a wide range of capabilities from large area 3d imaging to comprehensive process control and extensive material analysis product overview chipscanner large area 3d sem imaging ionmaster sims analysis for high resolution nm scale elemental mapping vector ai powered inspection and metrology electron beam lithography ebpg voyager pioneer e line raith150 elphy focused ion beams velion ionmaster elphy laser picomaster picomaster xf athos imaging analysis ionmaster chipscanner vector products technologies we continually push the boundaries of nanotechnology a commitment we take very seriously over the past four decades our intense focus and dedication have led to numerous groundbreaking innovations exploring the depths of nanotechnology ultrapositioning ionselect smartmotion magsims perfectshapes fasthr autorun proimage optifly infinitrace easyswitch rapidtrace holosuite technologies services the worldwide sales and service structure is backed by dedicated experts in our international application and development centers global departments and local factories work hand in hand service contracts services contacts updates upgrades service on demand service contact form services company we are a global nanotech solutions provider defined by progress about us career downloads vision mission news micrograph award sustainability events contact us locations representatives references company search login contact fast hr today even the smallest high resolution hr nanostructures need to be structured to give the highest productivity yield and fidelity with fasthr this becomes possible raith technologies fasthr introduction our fasthr technology represents a breakthrough in ebl performance achieved by seamless integration and harmonization of our system s core components it enables ultra high resolution lithography across the full write field with maximum yield and productivity fasthr ensures exceptional resolution and pattern uniformity even at very high beam currents and at the edges of large write fields the result the fastest most precise and most reliable high resolution direct write patterning solution in the gaussian ebl market high resolution lithography accelerated high throughput with uncompromising precision key features highest beam current densities raith ebl systems feature advanced electron optics designs optimized for maintaining the smallest beam diameters even at high beam currents resulting in exceptionally high beam current densities by leveraging these capabilities both fast and high resolution lithography with high electron doses can be achieved down to the smallest nanostructures beam shape uniformity across the entire write field ultimate pattern uniformity even at large beam deflection angles is ensured through precise automatic system calibrations and continuous on the fly corrections of beam focus astigmatism and distortion across the entire write field this guarantees superior lithography performance in the write field corners even when using large writing fields beam current stability stable beam current is essential for achieving reproducible nanostructures and maintaining consistent pattern dimensions as a result minimization of critical dose variations is achieved with raith systems ensuring reliable pattern fidelity and repeatability throughout the entire lithography process benefits for precision at scale uniform high fidelity nanostructures across large write fields uniform and high fidelity patterns across the entire write field state of the art nanodevices particularly those used in nanophotonics and optoelectronics such as photonic crystals and metalenses demand highly reproducible and uniform nanostructures with the smallest critical dimensions cd over large areas raith ebl systems ensure consistent high fidelity patterning performance across the entire write field excellent stitching and overlay accuracy extremely precise pattern placement achieved with perfectly shaped well focused and ideally round beams even in the write field corners ensures superior stitching and overlay accuracy this precision enables reliable exposure of the highest resolution nanostructures even across large write fields high throughput even for the smallest nanostructures by exploiting high beam current densities while maintaining excellent beam focus raith systems maximize throughput for high resolution nanostructures shorter exposure dwell times beam on times further enhance overall writing speed without compromising resolution or pattern quality minimum overhead utilizing large write fields with outstanding pattern placement accuracy and maintained high resolution minimizes overhead from frequent stage movements and associated settling times as a result overall throughput is significantly improved even in complex or large area patterning tasks how it works fasthr enabling high resolution lithography with high beam currents fasthr technology relies on sophisticated beam calibration across the entire write field without proper calibration especially for large write fields beam imperfections are inevitable due to fundamental geometric and electron optical limitations fig 1a using precise calibration standards together with advanced calibration algorithms enables accurate correction of focus astigmatism and distortion within the selected write field for example even at the maximum deflection angle of a 1mm write field fasthr maintains a perfectly focused round beam shape with the highest placement accuracy during the calibration routine conducted prior to exposure correction parameters are determined stored in look up tables and subsequently applied to the beam on the fly during writing this process effectively eliminates the distortions shown in fig 1b resulting in the ideal beam characteristics illustrated in fig 1c after correction correcting the beam across the write field is one challenge maintaining optimal focus while operating at high beam currents is an even greater one thanks to superior electron optics and advanced beam calibration algorithms raith ebl systems achieve exceptionally high beam current densities enabling fast high resolution lithography with outstanding pattern placement accuracy even in the corners of large write fields as demonstrated in fig 3 and fig 4 fig 1a c a geometric and electron optical principles leading to the beam imperfections that can be seen in fig 1b b uncorrected beam showing astigmatism defocus and distortions c automatic correction of focus astigmatism and distortion excellent pattern uniformity nested ls with different pitches written at 20na beam current images taken in upper left lower left center upper right and lower right corner of 1mm write field uhr nested ls exposed in resist at writefield corners from left to right with 15 nm 20 nm 25 nm and 30 nm pitch respectively ebpg highest throughput automation and precision voyager high performance for shortest time to result need support for a specific application consult an expert want to experience our system first hand request a demo sign up for our newsletter hp name submit contact us send a message follow us on social media sectors optical telecommunication semiconductors quantum technologies consumer electronics life sciences defense space materials science photonics research rapid prototyping solutions patterning mix and match process control digital raith holography workflow products electron beam lithography focused ion beams laser lithography imaging analysis legal notice impressum privacy policy datenschutzerklärung 2024 raith gmbh headline this is a basic text element headline this is a basic text element close search advanced search any post type downloads events insights jobs pages posts products references sectors solutions technologies popular searches career downloads ebpg voyager
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